Logo image
Product defects root-cause analysis with natural language processing (NLP) models
Thesis   Open access

Product defects root-cause analysis with natural language processing (NLP) models

Vutivi Mabasa
MPhil, University of Johannesburg
2026
Handle:
https://hdl.handle.net/10210/522064

Abstract

Manufacturing companies and product engineers struggle to develop effective ways to detect and handle defective issues linked to their products due to the lack of streamlined ways to go through the customer’s online reviews to locate possible root causes associated with the defect information stated by the customers. The lack of a practical and automated approach can lead to delays in product recalls and recoveries. From the manufacturer’s standpoint, these risks can derail their business. This research explores deep learning techniques, namely, recurrent neural networks (RNN), Convolution neural networks (CNN), attention-based topic mechanisms, and natural language processing techniques to extract defect information and possible root causes from the online reviews. This research proposes a deep learning approach to give manufacturers possible ways to defect and flag product defects. The RNN layer is implemented to model sentiment analysis in online reviews. Then CNN layer is utilised to detect the kind of defect is mentioned in each of the online reviews. Lastly, the result of the RNN and CNN layers are fed into the attention-based topic model to extract a summary of keywords that provide insight related to the defect information from the online reviews linked to the products.
pdf
Mabasa V 2150333392.56 MBDownloadView
Open Access

Metrics

1 Record Views

Details

Logo image